Near-infrared fissure detection light source L-LXS-260X71R1050-CRACK

Detect the fissure and collapse edge of the crystalline silicon cell.
Detects a variety of defects such as dirt, finger prints and degliation.
High-quality uniformity and high-brightness light sources meet the use of different production lines.
Cracking and the gap in the edge of the collapse at the same time found out more excellent cost performance.

Categories: Industrial Lights, Non-standard light source

Description

Product features

Detect the fissure and collapse edge of the crystalline silicon cell.
Detects a variety of defects such as dirt, finger prints and degliation.
High-quality uniformity and high-brightness light sources meet the use of different production lines.
Cracking and the gap in the edge of the collapse at the same time found out more excellent cost performance.

Application areas
Other defects such as photovoltaic silicon wafers and cell cracks

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